晶片學程(Program on Integrated Circuit Design)

VLSI Testing 課程大綱

•   Introduction

•   Fault models

•   Fault Simulation & Test Generation

•   Design for Testability

•   Built-in-Self-Test

•   Boundary Scan

•   Core-based & SOC Testing

•   Test Compression

•   Memory Testing

•   Diagnosis & Debug

•   Special topics